Title: Seventh Canadian Powder Diffraction Workshop - 21st to 23rd of June 2010, Trois-Rivières, Québec, Canada ------------------------- Seventh Canadian Powder Diffraction Workshop Pavillon Ringuet, Université du Québec à Trois-Rivières, Québec, Canada Monday 21st to Wednesday 23rd of June 2010 http://www.cins.ca/cpdw/ The third day of workshop is PDF (Pair Distribution Function) and Total Scattering Analysis presented by Dr Thomas Proffen of Los Alamos National Laboratory, USA The main theme of the workshop is in the fundamentals of using powder diffraction, and assisting participants in using the Rietveld method. Lectures on a variety of topics are planned for the morning, with the afternoon practical sessions concentrating on using GSAS for performing Rietveld analysis for structure refinement and quantitative phase analysis. The first two days of this workshop concentrates on powder diffractoin and Rietveld Analysis. The third day focusses on PDF (Pair Distribution Function)/Total Scattering analysis of amorphous, disordered, poorly crystalline or nano-crystalline materials. Trois-Rivières is located roughly mid way between Montréal and Québec City. The most convenient airport is Dorval International Airport (now called Montréal-Trudeau Airport) in Montréal; and is a 75 minute drive from Montréal and from Québec City. ------------------ Directions and travel hints are given at: http://www.cins.ca/cpdw/travel.html Venue information and accommodation options (which includes option of 2 nights on campus package at Cdn $90) at: http://www.cins.ca/cpdw/venue.html and http://www.cins.ca/cpdw/accomm.html ------------------ Registration Costs (includes three breakfasts, three lunches, two dinners and taxes): University based (Student/Staff/Postdoc/Academic): Cdn $300 Regular : 450 $ CAN Campus Accommodation: For duration of the workshop, total campus accommodation cost is 100 $ CAN Registration form is downloadable from the following webpage. Payment options include bill, credit card and cheque. http://www.cins.ca/cpdw/registration.html Registration deadline of 1st June, 2010. ------------------ Chair: Professor Jacques Huot (Université du Québec à Trois-Rivières) Speakers/Tutors: Dr Robert Von Dreele (Argonne National Laboratory, USA) Dr Angus Wilkinson (Georgia Institute of Technology, USA) Dr Thomas Proffen (Los Alamos National Laboratory, USA) Dr Ian Swainson (National Research Council of Canada) Dr Michael Gharghouri (National Research Council of Canada) Lachlan Cranswick (National Research Council of Canada) Talks include: http://www.cins.ca/cpdw/program.html Introduction to Powder Diffraction and Powder Diffraction Hardware Introduction to the basics of crystallography Sample preparation, data collection considerations and phase identification using powder X-ray diffraction Introduction to Powder Profile Refinement Profile Refinement with GSAS Synchrotron and Neutron Experiments Freely available powder diffraction Software Beyond the Bragg peaks or why do we care about total scattering? Measuring total scattering X-ray and neutron data: where and how? What to do with your PDF: Modeling of disordered structures ---------- Brief Pictorial History of the Rietveld Method On the logo webpage, a brief pictorial history of the Rietveld method is included: http://www.cins.ca/cpdw/logo.html ---------- A poster for the workshop is downloadable at: http://www.cins.ca/cpdw/images/cpdw_poster_2010.pdf If there are students and/or XRD users in your institute who might benefit from attending such a workshop, we would be appreciate it if this were brought to their attention. Please download the poster and post on departmental notice boards if appropriate. ====================================================================